中英
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testing of materials中文是什么意思
发音:
- 中文翻译
- 造句
- 材料试验
- test n. 【动物；动物学】(软体类的)介壳，甲壳；【植物；植 ...
- material adj. 1.物质的(opp. spiritual)。 ...
- materials testing 材料试验
- american society for testing materials 美国材料试验协会; 美国材料试验学会; 美中试验材料协会
- american society of testing materials 美国试验材料学会
- american society testing and materials 美国材料与试验协会
- american society testing materials 美国材料试验协会
- american standard of testing materials 美国材料试验标准; 美国试验材料标准
- materials testing laboratory 材料试验室
- materials testing machine 材料试验机
- materials testing reactor 材料试验反应堆
- materials-testing reactor 材料试验反应堆
- metallic materials compression testing 金属压缩试验方法
- metallic materials tensile testing 金属拉伸试验法
- method of testing materials 材料试验方法
- structural materials testing machine 建材试验机
- and materials 经验与教材，137，146
- materials 版本; 材料费; 材料工艺学; 材料类; 材质对话框; 工业三废; 建材; 教材; 物料; 衣料，材料; 用料清单; 原材料; 原村料; 原料学
- testing 测试系统; 吃力的; 复合地层试井; 检验的; 施测; 试验的; 试验方法; 试验设备
- ablating materials 烧蚀材料
- abuse materials 滥用资源
- acceptance of materials 材料验收
- accountancy of materials 物资会计
- acidic materials 酸性物质
- acquisition of materials 物资采购, 资料收集
- Testing of materials for semiconductor technology - determination of impurity content in semiconductors by infrared absorption - part 2 : boron in gallium arsenide
半导体工艺材料试验.通过红外线吸收测定半导体中杂质 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 5 : terms of shape and flatness deviation
半导体技术试验.半导体片几何尺寸测定.第5部分:形状 - Testing of materials for semiconductor technology - contactless determination of the electrical sheet resistance of semiconductor layers with the eddy - current method
半导体工艺材料的检验.用涡流法无接点测量半导体层的 - Testing of materials for semiconductor technology - methods for the characterisation photoresists - part 2 : determination of photosensitivity of positive photoresists
半导体技术用材料的试验.表征光敏抗蚀剂的方法.第2部 - Methods of testing refractory materials - unshaped refractories used in monolithic construction - testing of materials as preformed test pieces
耐火材料试验方法.第7部分:整体结构用未成形耐火材料.第6节:预制试件材料试验 - Testing of materials for semiconductor technology - contactless determination of the electrical resistivity of semi - insulating semi - conductor slices using a capacitive probe
半导体工艺材料试验.使用电容式探测器对半绝缘半导体 - Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 3 : determination of cationic impurities
半导体工艺技术用材料的试验.电子元件模塑化合物材料 - Testing of materials for semiconductor technology ; determination of impurities in carrier gases and dopant gases ; determination of c - c - hydrocarbons in nitrogen by gas - chromatography
半导体工艺材料的检验.运载气体和掺杂剂气体中杂质的 - Testing of materials for semiconductor technology - determination of traces of elements in liquids - part 3 : aluminium , cobalt , copper , sodium , nickel and zinc in nitric acid by icp - ms
半导体工艺用材料测试.液体中痕量元素测定.第3部分 - Testing of materials for semiconductor technology - determination of trace elements in liquids - part 1 : silver , gold , calcium , copper , iron , potassium and sodium in nitric acid by aas
半导体工艺材料检验.液体中痕量元素测定.用原子吸收
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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT
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