testing of materials中文是什么意思

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中文翻译
造句

材料试验

test n. 【动物；动物学】(软体类的)介壳，甲壳；【植物；植 ...
material adj. 1.物质的(opp. spiritual)。 ...
materials testing 材料试验
american society for testing materials 美国材料试验协会; 美国材料试验学会; 美中试验材料协会
american society of testing materials 美国试验材料学会
american society testing and materials 美国材料与试验协会
american society testing materials 美国材料试验协会
american standard of testing materials 美国材料试验标准; 美国试验材料标准
materials testing laboratory 材料试验室
materials testing machine 材料试验机
materials testing reactor 材料试验反应堆
materials-testing reactor 材料试验反应堆
metallic materials compression testing 金属压缩试验方法
metallic materials tensile testing 金属拉伸试验法
method of testing materials 材料试验方法
structural materials testing machine 建材试验机
and materials 经验与教材，137，146
materials 版本; 材料费; 材料工艺学; 材料类; 材质对话框; 工业三废; 建材; 教材; 物料; 衣料，材料; 用料清单; 原材料; 原村料; 原料学
testing 测试系统; 吃力的; 复合地层试井; 检验的; 施测; 试验的; 试验方法; 试验设备
ablating materials 烧蚀材料
abuse materials 滥用资源
acceptance of materials 材料验收
accountancy of materials 物资会计
acidic materials 酸性物质
acquisition of materials 物资采购, 资料收集

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例句与用法

Testing of materials for semiconductor technology - measurement of carrier lifetime in silicon single crystals - recombination carrier lifetime at low injection by photoconductivity method
半导体工艺材料的试验.硅单晶中载流子寿命的测量.用
1902 - 702 methods of testing refractory materials - unshaped refractories used in monolithic construction - testing of material as supplied and received method 1902 - 702
耐火材料的试验方法.第7部分:整体结构用未成形耐火材料.第2节:供货与收货材料试验
Testing of materials for semiconductor technology ; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method ; homogeneously doped semiconductor wafers
半导体工艺材料检验.用涡流法无接触测定电阻率.均匀
Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 4 : slice diameter , diamter variation , flat diameter , flat length , flat depth
半导体工艺用材料的试验.半导体圆片几何尺寸的测定
Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 2 : determination of ionic impurities using pressure cooker test
半导体工艺材料的试验.电子元件用模塑化合物的特性表
Testing of materials for semiconductor technology ; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
半导体技术材料的试验.用电容-电压法和水银接点确定
Testing of materials for semiconductor technology ; measurement of the geometric dimensions of semiconductor slices ; determination of flatness deviation of polished slices by means of the multiple beam interference
半导体工艺材料的检验.第3部分:半导体切片几何尺寸的
Testing of materials for semiconductor technology - determination of trace elements in liquids - part 2 : calcium , cobalt , chromium , copper , iron , nickel and zinc in hydrofluoric acid with plasma - induced emission spectroscopy
半导体工艺材料测试.液体中痕量元素测定.第2部分:用
Where the period for submitting an opposition against the application has expired and the tests of material of the plant variety have been finalised , the examination of the application shall continue
当可以提出异议的公告期满且测试已完成后，该申请之审核将继续进行，有关于这个审核，第四至八条适用之。

更多例句： 1 2 3 4 5

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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT