Specification for harmonized system of quality assessment for electronic components - family specification - ttl advanced low power schottky digital integrated circuits series 54 als , 74 als 电子元器件质量评定协调体系规范.系列规范: ttl改进的小功率肖特基数字集成电路系列54als 74als
Semiconductor devices ; integrated circuits ; part 2 : digital integrated circuits ; section 1 : blank detail specification for bipolar monolithic digital integrated circuits gates excluding uncommitted logic arrays 半导体器件.集成电路.第2部分:数字集成电路.第1节:双极整体数字集成电路门
Semiconductor devices - integrated circuits - part 2 : digital integrated circuits - section one - blank detail specification for bipolar monolithic digital integrated circuit gates excluding uncommitted logic arrays 半导体器件集成电路第2部分:数字集成电路第一篇双极型单片数字集成电路门电路
Semiconductor devices lntegrated circuits part 2 : digital integrated circuits section five - blank detail specification for complementary mos digital integrated circuits , series 4000b and 4000ub 半导体器件集成电路第2部分:数字集成电路第五篇cmos数字集成电路4000b和4000ub系列空白详细规范
Semiconductor devices . integrated circuits . part 2 : digital integrated circuits . section two - family specification for hcmos digital integrated circuits series 54 74hc , 54 74hct , 54 74hcu 半导体器件集成电路第2部分:数字集成电路第二篇hcmos数字集成电路54 74hc 54 74hct 54 74hcu系列族规范
With the development of manufacturing technology of digital integrated circuit , the voltage test method based on stuck - at fault model can not detect all the faults in modern integrated circuit 随着集成电路制造技术的发展,基于固定型故障模型的电压测试技术越来越不能满足高性能集成电路的需求。
Semiconductor devices ; integrated circuits ; part 2 : digital integrated circuits ; section 7 : blank detail specification for integrated circuit fusible - link programmable bipolar read - only memories 半导体器件.集成电路.第2部分:数字集成电路.第7节:集成电路可熔断线路可编程双极只读存储器空白详细规范
Semiconductor devices - integrated circuits - part 2 : digital integrated circuits ; section 9 : blank detail specification for mos ultraviolet light erasable electrically programmable read - only memories 半导体器件.集成电路.第2部分:数字集成电路.第9节: mos超紫外光可删除可编程只读存储器空白详细规范
Semiconductor devices ; integrated circuits ; part 2 : digital integrated circuits ; section four : family specification for complementary mos digital integrated circuits ; series 4000 b and 4000 ub 半导体器件.集成电路.第2部分:数字集成电路.第4节:互补金属氧化物半导体数字集成电路类规范.系列4000b和4000ub
Semiconductor devices . integrated circuits - part 2 : digital integrated circuits . section three - blank detail specification for hcmos digital integrated circuits series 54 74hc , 54 74hct , 54 74hcu 半导体器件集成电路第2部分:数字集成电路第三篇hcmos数字集成电路54 74hc 54 74hct 54 74hcu系列空白详细规范