中英
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testing of materials中文是什么意思
发音:
- 中文翻译
- 造句
- 材料试验
- test n. 【动物；动物学】(软体类的)介壳，甲壳；【植物；植 ...
- material adj. 1.物质的(opp. spiritual)。 ...
- materials testing 材料试验
- american society for testing materials 美国材料试验协会; 美国材料试验学会; 美中试验材料协会
- american society of testing materials 美国试验材料学会
- american society testing and materials 美国材料与试验协会
- american society testing materials 美国材料试验协会
- american standard of testing materials 美国材料试验标准; 美国试验材料标准
- materials testing laboratory 材料试验室
- materials testing machine 材料试验机
- materials testing reactor 材料试验反应堆
- materials-testing reactor 材料试验反应堆
- metallic materials compression testing 金属压缩试验方法
- metallic materials tensile testing 金属拉伸试验法
- method of testing materials 材料试验方法
- structural materials testing machine 建材试验机
- and materials 经验与教材，137，146
- materials 版本; 材料费; 材料工艺学; 材料类; 材质对话框; 工业三废; 建材; 教材; 物料; 衣料，材料; 用料清单; 原材料; 原村料; 原料学
- testing 测试系统; 吃力的; 复合地层试井; 检验的; 施测; 试验的; 试验方法; 试验设备
- ablating materials 烧蚀材料
- abuse materials 滥用资源
- acceptance of materials 材料验收
- accountancy of materials 物资会计
- acidic materials 酸性物质
- acquisition of materials 物资采购, 资料收集
- Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium monocrystals ; gravimetric method
半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第1部 - Testing of materials for semiconductor technology - test method for particle analysis in liquids - part 1 : microscopic determination of particles
半导体工艺用材料的检验.液体中粒子分析的试验方法 - Testing of materials for semiconductor technology ; methods for characterizing photoresists ; determination of coating thickness with optical methods
半导体工艺材料的检验.表示光致抗蚀剂特性的方法.第1 - Testing of materials for semiconductor technology - test method for particle analysis in liquids - part 3 : calibration of optical particle counters
半导体工艺材料的检验.液体中颗粒分析的试验方法.第3 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 2 : testing of edge profile
半导体工艺材料的试验.半导体芯片几何尺寸的测量.第2 - Testing of materials for use in semiconductor technology ; detection of crystal defects and inhomogeneities in silicon single crystals by x - ray topography
半导体工艺使用材料的检验.第1部分:用x射线外形测量 - Testing of materials for semiconductor technology ; test method for particle analysis in liquids ; determination of particles with optical particle counters
半导体工艺材料的检验.液体中颗粒分析的试验方法.第2 - Testing of materials for semiconductor technology - determination of dislocations in monocrystals of iii - v - compound semi - conductors - part 1 : gallium arsenide
半导体工艺材料的检验. -化合物单晶体错位的测定 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 1 : thickness and thickness variation
半导体工艺材料试验.半导体片几何尺寸测量.第1部分 - Testing of materials for semiconductor technology - determination of impurity content in semiconductors by infrared absorption - part 1 : carbon in gallium arsenide
半导体工艺用材料的检验.通过红外线吸收测定- -连
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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT
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