Harmonized system of quality assessment for electronic components - blank detail specification - quartz crystal units - qualification approval 电子元器件的质量评估协调体系.空白详细规范.石英晶体元件
Measurement of quartz crystal unit parameters - phase offset method for measurement of motional capacitance of quartz crystal units 石英晶体元件参数的测定.第2部分:用相位偏离法测量石英晶体单元的动态电容
Quartz crystal units for use in electronic equipment . bland detail specification for . resistance welded quartz crystal units . assessment level e 电子设备用石英晶体元件空白详细规范电阻焊石英晶体元件评定水平e
Measurement of quartz crystal unit parameters - part 8 : test fixture for surface mounted quartz crystal units iec 60444 - 8 : 2003 ; german version en 60444 - 8 : 2003 石英晶体元件参数的测量.第8部分:表面安装的石英晶体
Quartz crystal units - a specification in the quality assessment system for electronic components . part 2 : sectional specification - capability approval 石英晶体元件电子元器件质量评定体系规范第2部分:分规范能力批准
Quartz crystal units - a specification in the quality assessment system for electronic components . part 3 : sectional specification - qualification approval 石英晶体元件电子元器件质量评定体系规范第3部分:分规范鉴定批准
Measurement of quartz crystal unit parameters - part 7 : measurement of activity and frequency dips of quartz crystal units iec 60444 - 7 : 2004 ; german version en 60444 - 7 : 2004 石英晶体元件参数的测量.第7部分:石英晶体元件的活性
Measurement of quartz crystal unit parameters - methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction 石英晶体元件参数测量.第5部分:用自动网络分析仪和误差修正技术测定等效电气参数