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逆相的英文

音标:[ nìxiāng ]   发音:
  • phase inversion

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  • 例句与用法
  • 5 ) as the deformation strain increases the reverse transformation temperature and thermal hystersis of tini film increase on the first heating , while the martensitic transformation temperature decreases and r phase transition temperature is constant
    随预应变量增大, tint薄膜的第一次逆相变温度升高,相变热滞增大,马氏体相变温度降低, r相变温度无明显变化。
  • Determined by dsc . whereafter , the surface micro - morphology of both sides of tini sma thin film deposited on glass was investigated by atomic force microscope ( afm ) , and the difference of morphology between the two sides is observed . it has been shown that , in the growing surface of sputtered tini film , the trend of grain to accumulating along the normal direction like a column is clearly observed , and the grain is very loose which resulted in more microcavities , but in the surface facing to glass substrate , grain is so compact that there are hardly microcavities
    通过溅射法,在玻璃衬底上淀积了tini薄膜,并在600进行了真空退火, dsc法测得其马氏体逆相变峰值温度为75 ,利用原子力显微镜,对玻璃基tini形状记忆合金薄膜的衬底面与生长面进行了表面微观形貌分析,发现:生长面晶粒呈现出沿薄膜法线方向柱状堆积的趋势,晶粒致密性差,微孔洞多;而衬底面晶粒致密,几乎没有微孔洞存在。
  • In succession , tini thin film is deposited on single - crystal silicon substrate using optimized parameters utilizing sputtering , and its transformation temperature ( a * ) is 72 ? indicated by dsc curve after being annealed in an ultra - high vacuum ( uhv ) chamber . in addition , the composition of the silicon - based tini film was analyzed by an energy dispersive x - ray spectroscopy ( eds ) , and the ti content in the film is approximately 51at %
    按照改进的工艺参数,在单晶硅衬底上溅射-淀积了tini薄膜,并进行了超高真空退火, dsc法测得其马氏体逆相变峰值温度为72 ,利用能谱分析( eds )技术测得其ti含量约为51at ,通过对非晶tini薄膜与单晶硅衬底之间的界面进行eds及x射线衍射( xrd )分析,发现在用大功率( 2000w )直流磁控溅射法制备tini薄膜过程中,存在ti 、 ni与si的双向扩散,发生了界面反应,并有三元化合物ni _ 3ti _ 2si生成。
  • The structure and cycling properties of o2 - type products were studied too . the results proved that the material remained layered and did not transform to the spinal structure during cycling when it was cycled in 2 . 2 - 4 . 2v , it occurred irreversible phase transformation only when it further discharged to 1 . 0v . the granularity , shape and density of the grain were also studied
    本论文对合成的o2相材料进行了结构和循环过程研究,结果表明具有o2相结构的材料在2 . 2 - 4 . 2v之间循环时不发生相变,即使在循环10次后仍能够保持稳定的o2相层状结构,只有当电极放电至1 . 0v以下时,才会发生不可逆相变。
  • This paper uses multi - layer feedforward artificial neural networks ( abbr . mlf nns ) to approximate the nonlinear dynamic inversion on the basis of analyzing principle and characteristics of nonlinear dynamic inversion and neural networks . the pseudo - linear system has been synthesized by classic pid control and self - adaptive control separately
    将神经网络与非线性动态逆相结合,利用神经网络对系统的逆模型进行建模,对实现的伪线性系统分别设计pid控制和自适应控制两种方案进行综合。
  • This paper describes mainly system functions , measuring methods , circuit design , software program and errors analysis of a new type of measuring instrument . this instrument can measure and monitor electric parameters in single - phase circuits , three - phase ( three - wire or four - wire ) circuits . this system can be applied to electric devices and power plants , transformer substations with harmonic pollution . it can measure current , voltage , power , energy , frequence , power factor etc . it also can detect load quality , phase sequence , alarm , display and print results , as well as detect and dispose negative power
    该仪器适用于含有谐波污染情况下的机电设备现场、发电厂、供电局、企业变电所现场,可用来测量电流、电压、有功功率、无功功率、视在功率、有功电能、无功电能、视在电能以及频率和功率因数等电参数,并具有负载性质(感性、容性)判别,正、逆相序判别指示功能;超限报警功能;打印记录功能和负功检测及处理功能。
  • By differential scanning calorimetry ( dsc ) , respectively . without any supplementary method , a ti - rich alloy target ( ti - 48at % ni ) were used to enrich ti content in films during sputtering . as the first step , tini thin film is deposited on a glass substrate by sputtering , and annealed at 600
    采用丝材冷轧法,制备了75 m 、 90 m两种厚度的tini形状记忆薄膜,示差扫描量热( dsc )法测得其马氏体逆相变峰值温度分别为35 、 109 ,在溅射工艺中,采用富ti的tini合金靶( ti - 48at ni )而不是其它成分补偿措施,来增加tini薄膜中的ti含量。
  • 6 ) after incomplete phase transformation in the tini thin film , two reverse transformations occur on the second heating , but it returns back to one reverse transformation again on the third heating . therefore , the incomplete phase transformation has no effect on the property of micro - actuator using tini thin film
    不完全相变导致z薄膜第二次加热出观叹逆相变,但第三次逆相变又重新恢复为单一逆相变转变,因此对于tint薄膜微驱动器元件来讲,可以不考虑不完全相变对微驱动器元件性能的影响。
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Last modified time:Sat, 16 Aug 2025 00:29:56 GMT

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