Determination for electrical resistivity of dust in layer 粉尘层电阻率测定方法
Test method for resistivity of silicon epitaxial layers by area contacts three - probe techniques 硅外延层电阻率的面接触三探针.测试方法
The forward calculation shown that when providing current through whole casing pipe , the electrical potential on surface is mainly effected by shallow resistivity anomaly , whereas when providing current only at gun perforation position , the electrical potential is on surface mainly effected by corresponding resistivity of gun perforation position 正演结果表明:在全井套管供电时,地表观测电位主要受浅层电阻率不均匀性的影响;在射孔段供电时,地表观测电位主要反映射孔段的电阻率分布。