testing of material造句
例句与造句
- Testing of materials for semiconductor technology - determination of impurity content in semiconductors by infrared absorption - part 2 : boron in gallium arsenide
半导体工艺材料试验.通过红外线吸收测定半导体中杂质 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 5 : terms of shape and flatness deviation
半导体技术试验.半导体片几何尺寸测定.第5部分:形状 - Testing of materials for semiconductor technology - contactless determination of the electrical sheet resistance of semiconductor layers with the eddy - current method
半导体工艺材料的检验.用涡流法无接点测量半导体层的 - Testing of materials for semiconductor technology - methods for the characterisation photoresists - part 2 : determination of photosensitivity of positive photoresists
半导体技术用材料的试验.表征光敏抗蚀剂的方法.第2部 - Methods of testing refractory materials - unshaped refractories used in monolithic construction - testing of materials as preformed test pieces
耐火材料试验方法.第7部分:整体结构用未成形耐火材料.第6节:预制试件材料试验 - It's difficult to find testing of material in a sentence. 用testing of material造句挺难的
- Testing of materials for semiconductor technology - contactless determination of the electrical resistivity of semi - insulating semi - conductor slices using a capacitive probe
半导体工艺材料试验.使用电容式探测器对半绝缘半导体 - Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 3 : determination of cationic impurities
半导体工艺技术用材料的试验.电子元件模塑化合物材料 - Testing of materials for semiconductor technology ; determination of impurities in carrier gases and dopant gases ; determination of c - c - hydrocarbons in nitrogen by gas - chromatography
半导体工艺材料的检验.运载气体和掺杂剂气体中杂质的 - Testing of materials for semiconductor technology - determination of traces of elements in liquids - part 3 : aluminium , cobalt , copper , sodium , nickel and zinc in nitric acid by icp - ms
半导体工艺用材料测试.液体中痕量元素测定.第3部分 - Testing of materials for semiconductor technology - determination of trace elements in liquids - part 1 : silver , gold , calcium , copper , iron , potassium and sodium in nitric acid by aas
半导体工艺材料检验.液体中痕量元素测定.用原子吸收 - Testing of materials for semiconductor technology - measurement of carrier lifetime in silicon single crystals - recombination carrier lifetime at low injection by photoconductivity method
半导体工艺材料的试验.硅单晶中载流子寿命的测量.用 - 1902 - 702 methods of testing refractory materials - unshaped refractories used in monolithic construction - testing of material as supplied and received method 1902 - 702
耐火材料的试验方法.第7部分:整体结构用未成形耐火材料.第2节:供货与收货材料试验 - Testing of materials for semiconductor technology ; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method ; homogeneously doped semiconductor wafers
半导体工艺材料检验.用涡流法无接触测定电阻率.均匀 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 4 : slice diameter , diamter variation , flat diameter , flat length , flat depth
半导体工艺用材料的试验.半导体圆片几何尺寸的测定 - Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 2 : determination of ionic impurities using pressure cooker test
半导体工艺材料的试验.电子元件用模塑化合物的特性表