testing of material造句
例句与造句
- Testing of materials for semiconductor technology ; determination of the orientation of single crystals by means of laue back scattering
半导体工艺材料的检验.第3部分:采用劳埃反向散射法测 - Testing of materials for semiconductor technology - determination of impurity content in silicon by infrared absorption - part 1 : oxygen
半导体工艺材料检验.用红外吸收法测量硅的杂质含量 - This sht / pb apparatus can be used for both compress tests and tensile tests of materials at high strain rate
通过这种测试装置，即可进行材料的动态压缩试验，也可进行材料的动态拉伸试验。 - Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium - dioxid coating ; optical method
半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第2部 - Testing of materials for semiconductor technology - determination of etch rates of etching mixtures - part 3 : aluminium , gravimetric method
半导体技术试验.蚀刻混合剂浸蚀率测定.第3部分:铝.测 - It's difficult to find testing of material in a sentence. 用testing of material造句挺难的
- Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium monocrystals ; gravimetric method
半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第1部 - Testing of materials for semiconductor technology - test method for particle analysis in liquids - part 1 : microscopic determination of particles
半导体工艺用材料的检验.液体中粒子分析的试验方法 - Testing of materials for semiconductor technology ; methods for characterizing photoresists ; determination of coating thickness with optical methods
半导体工艺材料的检验.表示光致抗蚀剂特性的方法.第1 - Testing of materials for semiconductor technology - test method for particle analysis in liquids - part 3 : calibration of optical particle counters
半导体工艺材料的检验.液体中颗粒分析的试验方法.第3 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 2 : testing of edge profile
半导体工艺材料的试验.半导体芯片几何尺寸的测量.第2 - Testing of materials for use in semiconductor technology ; detection of crystal defects and inhomogeneities in silicon single crystals by x - ray topography
半导体工艺使用材料的检验.第1部分:用x射线外形测量 - Testing of materials for semiconductor technology ; test method for particle analysis in liquids ; determination of particles with optical particle counters
半导体工艺材料的检验.液体中颗粒分析的试验方法.第2 - Testing of materials for semiconductor technology - determination of dislocations in monocrystals of iii - v - compound semi - conductors - part 1 : gallium arsenide
半导体工艺材料的检验. -化合物单晶体错位的测定 - Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 1 : thickness and thickness variation
半导体工艺材料试验.半导体片几何尺寸测量.第1部分 - Testing of materials for semiconductor technology - determination of impurity content in semiconductors by infrared absorption - part 1 : carbon in gallium arsenide
半导体工艺用材料的检验.通过红外线吸收测定- -连