Testing of materials for semiconductor technology - measurement of carrier lifetime in silicon single crystals - recombination carrier lifetime at low injection by photoconductivity method 半导体工艺材料的试验.硅单晶中载流子寿命的测量.用
1902 - 702 methods of testing refractory materials - unshaped refractories used in monolithic construction - testing of material as supplied and received method 1902 - 702 耐火材料的试验方法.第7部分:整体结构用未成形耐火材料.第2节:供货与收货材料试验
Testing of materials for semiconductor technology ; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method ; homogeneously doped semiconductor wafers 半导体工艺材料检验.用涡流法无接触测定电阻率.均匀
Testing of materials for semiconductor technology - determination of the geometric dimensions of semiconductor wafers - part 4 : slice diameter , diamter variation , flat diameter , flat length , flat depth 半导体工艺用材料的试验.半导体圆片几何尺寸的测定
Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 2 : determination of ionic impurities using pressure cooker test 半导体工艺材料的试验.电子元件用模塑化合物的特性表