Testing of materials for semiconductor technology - contactless determination of the electrical resistivity of semi - insulating semi - conductor slices using a capacitive probe 半导体工艺材料试验.使用电容式探测器对半绝缘半导体
Testing of materials for semiconductor technology - method for the characterisation of moulding compounds for electronic components - part 3 : determination of cationic impurities 半导体工艺技术用材料的试验.电子元件模塑化合物材料
Testing of materials for semiconductor technology ; determination of impurities in carrier gases and dopant gases ; determination of c - c - hydrocarbons in nitrogen by gas - chromatography 半导体工艺材料的检验.运载气体和掺杂剂气体中杂质的
Testing of materials for semiconductor technology - determination of traces of elements in liquids - part 3 : aluminium , cobalt , copper , sodium , nickel and zinc in nitric acid by icp - ms 半导体工艺用材料测试.液体中痕量元素测定.第3部分
Testing of materials for semiconductor technology - determination of trace elements in liquids - part 1 : silver , gold , calcium , copper , iron , potassium and sodium in nitric acid by aas 半导体工艺材料检验.液体中痕量元素测定.用原子吸收