On the one hand , the definition of meter can be trace to the source via the step height in the surface measurement technology ; on the other hand , the problems of measurement of step height occur almost everywhere in the industrial domain that relies mainly on semiconductor manufacturing 表面台阶高度测量在表面计量学中有十分重要的作用。一方面,表面测量技术通过台阶高度可以溯源到米的定义;另一方面,半导体制造业为主的工业产业中涉及大量的台阶高度的检测问题。
Summarize the research results in the field of electronics and optics up to date , make used of electronics modulation put on to optical system to make it generate hyperchaos , and then we set up two devices , to study dynamic model these sceo , it based on semiconductor laser and erbium - doped fiber laser , more study make used of electronics modulation put on to optical system realize control and synchronization hyperchaos , that is , it use electric signal to control the dynamic behavior of the optical system 首先介绍了电光混合系统的混沌与超混沌的研究进展,概述了电学和光学领域中超混沌的最新研究成果。然后建立起以半导体激光器和双环铒光纤激光器为主要研究对象的电光混合系统的动力学模型,对光学系统施加电学调制使之产生超混沌,并利用电参数调整法对光学系统超混沌施加控制和同步,也就是用电去控制和左右光学系统的动力学行为。
The hsip was created in southern sponse , and to and with aims to maintain balanced regional development , meet the demands of upstream , midstream , and downstream businesses in the technology sector , and to nurture new technology industries . the stsp has differentiated itself from its counterpart in the north by focusing on semiconductor , microelectronics precision machinery , and agricultural biotechnology sectors 由于新竹科学工业园区产业发展已趋饱和,因应南北平衡区域经济均衡发展科技产业上中下游整体发展所需及孕育新兴科技产业,南部科学工业园区已区隔规划出半导体微电子精密机械农业生物科技产业专业区。
Especially , it becomes more and more important in the field of analysis of the thin layer ' s characteristics , analysis of contaminants on semiconductor wafers and surface test for ferromagnetic substance . because grazing x - ray fluorescence techniques have the advantages , which are non - destructive nature analysis method , simple and economical for sample preparation , good fidelity and high precision for results X射线分析技术具有试样无损分析、制样经济方便、操作简单、分析结果重现性好及精度高等优点,使得这项技术在薄膜特性分析、半导体材料及磁铁材料表面检测方面受到特别的青睐。