Testing of materials for semiconductor technology ; determination of the orientation of single crystals by means of laue back scattering 半导体工艺材料的检验.第3部分:采用劳埃反向散射法测
Testing of materials for semiconductor technology - determination of impurity content in silicon by infrared absorption - part 1 : oxygen 半导体工艺材料检验.用红外吸收法测量硅的杂质含量
This sht / pb apparatus can be used for both compress tests and tensile tests of materials at high strain rate 通过这种测试装置,即可进行材料的动态压缩试验,也可进行材料的动态拉伸试验。
Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium - dioxid coating ; optical method 半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第2部
Testing of materials for semiconductor technology - determination of etch rates of etching mixtures - part 3 : aluminium , gravimetric method 半导体技术试验.蚀刻混合剂浸蚀率测定.第3部分:铝.测