In the early 1980 ’ s , quiescent power supply current ( iddq ) testing method was proposed in cmos testing . testing method based on current testing have very good compatibility with cmos circuits , it can detect some faults and physical defects those cannot be detected by testing methods based on voltage testing 基于电流的iddq测试方法与cmos电路有很好的兼容性,它可检测出电压测试方法不能检测的故障和物理缺陷,目前已成为一种广为接受的重要的cmos数字集成电路的测试方法。